Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-29T23:56:12.814Z Has data issue: false hasContentIssue false
  • English
  • Français

Identification and Quantification of Boron Dopant Sites in Antiferromagnetic Cr2O3 Films by Electron Energy Loss Spectroscopy

Published online by Cambridge University Press:  04 August 2017

Congli Sun ,
Michael Street ,
Ryan Jacobs ,
Dane Morgan ,
Paul M. Voyles  and
Christian Binek
Congli Sun
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, USA
Michael Street
Affiliation:
Department of Physics and Astronomy, Nebraska Center for Materials and Nanoscience, University of Nebraska, Lincoln, Nebraska, USA
Ryan Jacobs
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, USA
Dane Morgan
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, USA
Paul M. Voyles
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, USA
Christian Binek
Affiliation:
Department of Physics and Astronomy, Nebraska Center for Materials and Nanoscience, University of Nebraska, Lincoln, Nebraska, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1584 - 1585
Copyright
© Microscopy Society of America 2017 

References

[1] He, X., et al, Nat. Mater. 9 2010). p. 579.Google Scholar
[2] Mu, S., Wysocki, A.L. & Belashchenko, K.D. Phys. Rev. B 87 2013). p. 1.Google Scholar
[3] Sauer, H., et al, Ultramicroscopy. 49 1993). p. 198.Google Scholar
[4] Souche, C., et al, Micron. 29 1998). p. 419.Google Scholar
[5] This work was supported in part by C-SPIN, one of the six centers of STARnet, a Semiconductor Research Corporation program, sponsored by MARCO and DARPA.Google Scholar