Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-23T20:40:03.585Z Has data issue: false hasContentIssue false
  • English
  • Français

History of JEOL Microbeam Analysis: High Accuracy Analyses for Scientific and Industrial Work from the Centimeter to Nanometer Scale

Published online by Cambridge University Press:  04 August 2017

Hideyuki Takahashi ,
Hiroyuki Yamada ,
Satoshi Notoya ,
Masaru Takakura ,
Takanori Murano ,
Vernon Robertson  and
Peter McSwiggen
Hideyuki Takahashi
Affiliation:
JEOL Ltd., 1-2 Musashino, 3-chome, Akishima, Tokyo, Japan.
Hiroyuki Yamada
Affiliation:
JEOL Ltd., 1-2 Musashino, 3-chome, Akishima, Tokyo, Japan.
Satoshi Notoya
Affiliation:
JEOL Ltd., 1-2 Musashino, 3-chome, Akishima, Tokyo, Japan.
Masaru Takakura
Affiliation:
JEOL Ltd., 1-2 Musashino, 3-chome, Akishima, Tokyo, Japan.
Takanori Murano
Affiliation:
JEOL Ltd., 1-2 Musashino, 3-chome, Akishima, Tokyo, Japan.
Peter McSwiggen
Affiliation:
JEOL USA, 11 Dearborn Rd. Peabody, MA, USA.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1018 - 1019
Copyright
© Microscopy Society of America 2017 

References

[1] “Souzou to Kaihatsu” (Japanese), Creation and Development in JEOL Ltd. 60 Year Anniversary” (2010).Google Scholar
[2] Reed, J. B. “Electron Microprobe Analysis second edition”, (Cambridge University Press).Google Scholar
[3] Terauchi, M., et al, J. Electron Microscopy 61 2012). p. 1.Google Scholar
[4] MacRae, C.M., et al, Microscopy & Microanalysis 22(S3 2016). p. 410.Google Scholar