Grazing Incidence X-ray Optics for Wavelength Dispersive Spectrometers in Micro-Analysis

David OHara

doi:10.1017/S1431927603444450

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Grazing Incidence X-ray Optics for Wavelength Dispersive Spectrometers in Micro-Analysis

Published online by Cambridge University Press: 01 August 2003

David OHara

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David OHara*: Affiliation:
Parallax Research, Inc. PO Box 12212, Tallahassee, FL 32317, USA

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Information: Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 890 - 891

DOI: https://doi.org/10.1017/S1431927603444450 [Opens in a new window]
Copyright: Copyright © Microscopy Society of America 2003

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Grazing Incidence X-ray Optics for Wavelength Dispersive Spectrometers in Micro-Analysis

Volume 9, Issue S02
David OHara ^(a1)
DOI: https://doi.org/10.1017/S1431927603444450

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Grazing Incidence X-ray Optics for Wavelength Dispersive Spectrometers in Micro-Analysis

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