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Focused-Probe STEM Ptychography: Reconstruction Methods, Transfer Functions and Signal-to-Noise

Published online by Cambridge University Press:  01 August 2018

P D Nellist ,
G T Martinez ,
C O’ Leary ,
H. Yang ,
A. Stevens  and
N.D. Browning
P D Nellist
Affiliation:
Department of Materials, University of Oxford, Parks Rd, Oxford UK.
G T Martinez
Affiliation:
Department of Materials, University of Oxford, Parks Rd, Oxford UK.
C O’ Leary
Affiliation:
Department of Materials, University of Oxford, Parks Rd, Oxford UK.
H. Yang
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California
A. Stevens
Affiliation:
OptimalSensing, Southlake, Texas. Duke University, ECE, Durham, North Carolina.
N.D. Browning
Affiliation:
University of Liverpool, Materials Engineering, Liverpool, UK

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 488 - 489
Copyright
© Microscopy Society of America 2018 

References

[1] Yang, H., et al Nature. Communications 7 2016) p. 12532.Google Scholar
[2] Jiang, Y., et al arXiv:1801.04630.Google Scholar
[3] Yang, H., Pennycook, T. J. Nellist, P. D. Ultramicroscopy 151 2015) p. 232.Google Scholar
[4] Stevens, A., et al, Appl. Phys. Lett. 112 2018) p. 043104.Google Scholar
[5] The authors acknowledge the contribution to the experimental data used below from JEOL Ltd (Y. Kondo and R. Sagawa) and PNDetector (M. Huth, M. Simson and H. Soltau). Financial support from JEOL UK Ltd and the EPSRC (grant number EP/M010708/1) is gratefully acknowledged..Google Scholar