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FIB Preparation and STEM Observation of Specified Area from Two Direction

Published online by Cambridge University Press:  01 August 2005

T Kuba
Affiliation:
JEOL Ltd.
N Endo
Affiliation:
JEOL Ltd.
E Okunishi
Affiliation:
JEOL Ltd.
T Suzuki
Affiliation:
JEOL Ltd.

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Copyright
© 2005 Microscopy Society of America