Hostname: page-component-586b7cd67f-rcrh6 Total loading time: 0 Render date: 2024-11-23T10:55:26.317Z Has data issue: false hasContentIssue false
  • English
  • Français

Expanding the Capability of Xe Plasma Focused Ion Beam Sample Preparation for Transmission Electron Microscopy

Published online by Cambridge University Press:  30 July 2021

Suzy Vitale  and
Joshua Sugar
Suzy Vitale
Affiliation:
Carnegie Institution for Science, Washington, District of Columbia, United States
Joshua Sugar
Affiliation:
Sandia National Laboratories, Livermore, California, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in and Materials and Life Sciences
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 218 - 219
Check for updates
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Burnett, TL et al. , Ultramicroscopy 161 (2016) pp. 119-129.CrossRefGoogle Scholar
Nicholas, MG and Old, CF, Journal of Materials Science 14 (1979), pp. 1-18.CrossRefGoogle Scholar
Hugo, RC and Hoagland, RG, Scripta Materialia 41 (1999), pp. 1341-1346.CrossRefGoogle Scholar
Senel, E et al. , Corrosion Science 85 (2014), pp. 167-173.CrossRefGoogle Scholar
Kelley, R et al. , Microscopy and Microanalysis 19 [S2] (2013), pp. 862-863.CrossRefGoogle Scholar
Wirth, R, European Journal of Mineralogy 16 (2004), pp. 863-876.CrossRefGoogle Scholar
Giannuzzi, LA and Smith, NS, Microscopy and Microanalysis 17 [S2] (2011), pp. 646-647.Google Scholar
MacLaren, I et al. , Microscopy and Microanalysis 25 (2019), pp. 115-118.CrossRefGoogle Scholar
Malis, T et al. , Journal of Microscope Technique 8 (1988), pp. 193-200.CrossRefGoogle Scholar