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Enhancement of the TEM Image Contrast and Elemental Mapping using EFTEM Combined with Cryo-TEM for Particles in Aqueous Solution

Published online by Cambridge University Press:  01 August 2005

G Kim
G Kim
Affiliation:
Dow Corning Corporation, Midland, Michigan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 1050 - 1051
Copyright
© 2005 Microscopy Society of America