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Enhanced Sensitivity of Atomic-Resolution Spectroscopic Imaging by Direct Electron Detection

Published online by Cambridge University Press:  04 August 2017

David J. Baek ,
Berit H. Goodge ,
Di Lu ,
Yasuyuki Hikita ,
Harold Y. Hwang  and
Lena F. Kourkoutis
David J. Baek
Affiliation:
School of Electrical and Computer Engineering, Cornell University, Ithaca, NY, USA.
Berit H. Goodge
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA.
Di Lu
Affiliation:
Department of Physics, Stanford University, Stanford, CA, USA.
Yasuyuki Hikita
Affiliation:
Stanford Institute for Materials and Energy Sciences, SLAC, Menlo Park, CA, USA.
Harold Y. Hwang
Affiliation:
Stanford Institute for Materials and Energy Sciences, SLAC, Menlo Park, CA, USA. Department of Applied Physics, Stanford University, Stanford, CA, USA.
Lena F. Kourkoutis
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA. Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, NY, USA.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 366 - 367
Copyright
© Microscopy Society of America 2017 

References

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[5] This work was supported by the Cornell Center for Materials Research with funding from the NSF (DMR-1120296 and DMR-1429155).Google Scholar