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Enhanced Resolution from Full-Field Ptychography with an Electron Microscope Pixel Array Detector

Published online by Cambridge University Press:  04 August 2017

Yi Jiang ,
Yimo Han ,
Zhen Chen ,
Veit Elser  and
David A. Muller
Yi Jiang
Affiliation:
Department of Physics, Cornell University, Ithaca NY, USA
Yimo Han
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca NY, USA
Zhen Chen
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca NY, USA
Veit Elser
Affiliation:
Department of Physics, Cornell University, Ithaca NY, USA
David A. Muller
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca NY, USA Kavli Institute at Cornell for Nanoscale Science, Ithaca NY, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 438 - 439
Copyright
© Microscopy Society of America 2017 

References

[1] Tate, M., et al, Microscopy and Microanalysis 22 2016). p. 237–249.Google Scholar
[2] Han, Y., et al, Microscopy and Microanalysis 22 2016). p. 870–871.CrossRefGoogle Scholar
[3] Nguyen, K., et al, Microscopy and Microanalysis 22 2016). p. 472–473.Google Scholar
[4] Maiden, A., et al, J. Opt. Soc. Am. 28 2011). p. 604–612.CrossRefGoogle Scholar
[5] Y. Jiang is supported by DOE grant DE-SC0005827. Facility support from NSF DMR-1120296. Helpful discussion with Martin Humphries and Peter Nellist are acknowledged.Google Scholar