Hostname: page-component-586b7cd67f-2plfb Total loading time: 0 Render date: 2024-11-29T19:22:52.996Z Has data issue: false hasContentIssue false
  • English
  • Français

The effect of laser energy on the measurement of oxide stoichiometry of Co2FeO4 nanoparticles by atom probe tomography

Published online by Cambridge University Press:  30 July 2021

Tong Li ,
Weikai Xiang  and
Arjun Bala Krishnan
Tong Li
Affiliation:
Ruhr University Bochum, Bochum, Nordrhein-Westfalen, Germany
Weikai Xiang
Affiliation:
Ruhr University Bochum, Bochum, Germany
Arjun Bala Krishnan
Affiliation:
Ruhr University Bochum, Bochum, Germany

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advanced Application of Atom Probe Tomography: Specimen preparation, Instrumentation, and Data analysis
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 990 - 991
Check for updates
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Li, T., Bagot, P. A., Christian, E., Theobald, B. R., Sharman, J. D., Ozkaya, D., Moody, M. P., Tsang, S. E., Smith, G. D., Acs Catalysis 4 (2014) 695-702.Google Scholar
Devaraj, A., Colby, R., Hess, W. P., Perea, D. E., Thevuthasan, S., The journal of physical chemistry letters 4 (2013) 993-998.CrossRefGoogle Scholar
Chen, Z. and Gao, L., Materials Science and Engineering: B 141 (2007) 82-86.CrossRefGoogle Scholar
Kim, S. H., Kang, P. W., Park, O. O., Seol, J. B., Ahn, J. P., Lee, J. Y., Choi, P. P., Ultramicroscopy 190 (2018) 30-38.CrossRefGoogle Scholar
Haydock, R. and Kingham, D. R., Surface Science 104 (1981) L194-L198.CrossRefGoogle Scholar
Marceau, R. K., Choi, P., Raabe, D., Ultramicroscopy 132 (2013) 239-247.CrossRefGoogle Scholar
Gault, B., Danoix, F., Hoummada, K., Mangelinck, D., Leitner, H., Ultramicroscopy 113 (2012) 182-191.CrossRefGoogle Scholar