Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-23T10:29:17.628Z Has data issue: false hasContentIssue false
  • English
  • Français

Direct Electron Detection for Atomic-Resolution EELS Mapping at Cryogenic Temperature

Published online by Cambridge University Press:  01 August 2018

David J. Baek ,
Michael J. Zachman ,
Berit H. Goodge ,
Di Lu ,
Yasuyuki Hikita ,
Harold Y. Hwang  and
Lena F. Kourkoutis
David J. Baek
Affiliation:
School of Electrical and Computer Engineering, Cornell University, Ithaca, NY, USA.
Michael J. Zachman
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA.
Berit H. Goodge
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA.
Di Lu
Affiliation:
Department of Applied Physics, Stanford University, Stanford, CA, USA.
Yasuyuki Hikita
Affiliation:
Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, Menlo, Park, CA, USA.
Harold Y. Hwang
Affiliation:
Department of Applied Physics, Stanford University, Stanford, CA, USA. Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, Menlo, Park, CA, USA.
Lena F. Kourkoutis
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA. Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, NY, USA.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 454 - 455
Copyright
© Microscopy Society of America 2018 

References

[1] Muller, D. A., et al, Science 319 2008) p. 1073.Google Scholar
[2] Klie, R. F., et al, Phys. Rev. Lett. 99 2007) p. 047203.Google Scholar
[3] Zhao, W., et al. (2017) arXiv 1701, 03678.Google Scholar
[4] Hart, J. L., et al, Scientific Reports 7 2017) p. 8243.Google Scholar
[5] This work was supported by the Department of Defense Air Force Office of Scientific Research (FA 9550-16-1-0305) and National Science Foundation (DMR-1539918, DMR-1429155, DMR-1719875).Google Scholar