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Development of a Segmented Detector for Aberration Corrected Scanning Transmission Electron Microscopes

Published online by Cambridge University Press:  01 August 2010

Y Kohno ,
N Shibata ,
H Sawada ,
SD Findlay ,
Y Kondo  and
Y Ikuhara
Y Kohno
Affiliation:
JEOL Ltd, Japan
N Shibata
Affiliation:
University of Tokyo, Japan
H Sawada
Affiliation:
JEOL Ltd, Japan
SD Findlay
Affiliation:
University of Tokyo, Japan
Y Kondo
Affiliation:
JEOL Ltd, Japan
Y Ikuhara
Affiliation:
University of Tokyo, Japan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 760 - 761
Copyright
Copyright © Microscopy Society of America 2010