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A Confocal Scanning Optical Microscope System for Measuring Refractive Index Profiles of Specialty Optical Waveguides

Published online by Cambridge University Press:  01 August 2005

Y Youk  and
D Y Kim
Y Youk
Affiliation:
Gwangju Institute of Science and Technology,South Korea
D Y Kim
Affiliation:
Gwangju Institute of Science and Technology,South Korea

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 726 - 727
Copyright
© 2005 Microscopy Society of America