Comparative IR Microanalysis of Multilayer Samples Using IR Imaging and Mapping

Thomas J. Tague Jr.

doi:10.1017/S1431927603445376

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Comparative IR Microanalysis of Multilayer Samples Using IR Imaging and Mapping

Published online by Cambridge University Press: 24 July 2003

Thomas J. Tague Jr.

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Thomas J. Tague Jr.*: Affiliation:
Bruker Optics, Inc., 19 Fortune Drive, Billerica, MA 01821

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Type: Abstract
Information: Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 1074 - 1075

DOI: https://doi.org/10.1017/S1431927603445376 [Opens in a new window]
Copyright: Copyright © Microscopy Society of America 2003

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Comparative IR Microanalysis of Multilayer Samples Using IR Imaging and Mapping

Volume 9, Issue S02
Thomas J. Tague, Jr. ^(a1)
DOI: https://doi.org/10.1017/S1431927603445376

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Comparative IR Microanalysis of Multilayer Samples Using IR Imaging and Mapping

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