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Combining in-Situ SEM with High Sensitivity Analytical TEM for Understanding the Degradation of Metallic Interconnects in SOFC

Published online by Cambridge University Press:  04 August 2017

Stéphane Poitel ,
Zhu-Jun Wang ,
Marc Willinger ,
Jan van Herle  and
Cécile Hébert
Stéphane Poitel
Affiliation:
Centre Interdisciplinaire de Microscopie Electronique, Ecole Polytechnique Fédérale de Lausanne, Lausanne, Switzerland. Group of Energy Materials, Ecole Polytechnique Fédérale de Lausanne, Sion, Switzerland.
Zhu-Jun Wang
Affiliation:
Department of Inorganic Chemistry, Fritz Haber Institute of the Max Planck Society, Berlin, Germany.
Marc Willinger
Affiliation:
Department of Inorganic Chemistry, Fritz Haber Institute of the Max Planck Society, Berlin, Germany.
Jan van Herle
Affiliation:
Group of Energy Materials, Ecole Polytechnique Fédérale de Lausanne, Sion, Switzerland.
Cécile Hébert
Affiliation:
Centre Interdisciplinaire de Microscopie Electronique, Ecole Polytechnique Fédérale de Lausanne, Lausanne, Switzerland.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 2060 - 2061
Copyright
© Microscopy Society of America 2017 

References

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[3] Harthøj, A., Holt, T. & Mailer, P. Journal of Power Sources 281 2015). p. 227.CrossRefGoogle Scholar