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Characterizing the Back-Contact Interface of Poly-Crystalline Cd(Se)Te Devices with XEDS, EELS, and HRSTEM
Published online by Cambridge University Press: 30 July 2021
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- Nanoscale x-ray and Electron Microscopy Techniques and Applications in Material Science
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- Copyright
- Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America
References
Shockley, W. and Queisser, H. J., “Detailed balance limit of efficiency of p-n junction solar cells,” J. Appl. Phys., vol. 32, no. 3, pp. 510–519, 1961.CrossRefGoogle Scholar
Davies, A. R. and Sites, J. R.. Effects of non-uniformity on rollover phenomena in CdS/CdTe solar cells. In 33rd IEEE Photovoltaic Specialists Conference, 2008.A. R. Davies and J. R. Sites. Effects of non-uniformity on rollover phenomena in CdS/CdTe solar cells. In 33rd IEEE Photovoltaic Specialists Conference, 2008.Google Scholar
This material is based upon work supported by the U.S. Department of Energy's Office of Energy Efficiency and Renewable Energy (EERE) under the Solar Energy Technologies Office Award Number DE-EE0008974.Google Scholar
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