Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-29T16:52:49.058Z Has data issue: false hasContentIssue false
  • English
  • Français

Characterization of Nano-Scale Defects in Pulsed Laser Deposited (PLD) Thin Films of Li3xNd(2/3-x)(1/3-2x)TiO3 (NLTO) by Aberration Corrected HR-STEM Imaging and Dual-EELS

Published online by Cambridge University Press:  30 July 2020

Robert Williams ,
Nuria Bagues ,
Elahe Farghadany ,
Alp Sehirlioglu  and
David McComb
Robert Williams
Affiliation:
The Ohio State University, Hilliard, Ohio, United States
Nuria Bagues
Affiliation:
The Ohio State University, Columbus, Ohio, United States
Elahe Farghadany
Affiliation:
Case Western Reserve Univeristy, Cleveland, Ohio, United States
Alp Sehirlioglu
Affiliation:
Case Western Reserve Univeristy, Cleveland, Ohio, United States
David McComb
Affiliation:
Center for Electron Microscopy and Analysis/ Department of Material Science and Engineering, The Ohio State University, Columbus, Ohio, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Energy and Soft Materials and the Development of Cryogenic Techniques for Studying Them
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 3166 - 3167
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Dholabhai, P.P., et al. , Nature Communications, 5:5043, 2014 . doi:10.1038/ncomms6043CrossRefGoogle Scholar
Stramere, S., et al. , Chemical Materials, (15) 3974, 2003.Google Scholar