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Big, deep, and smart data from atomically resolved images: exploring the origins of materials functionality
Published online by Cambridge University Press: 25 July 2016
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- Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1416 - 1417
- Copyright
- © Microscopy Society of America 2016
References
[3]
Sumpter, BG, Vasudevan, RK, Potok, T & Kalinin, SV
npj Comp. Mater
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(2015). p. 15008.CrossRefGoogle Scholar
[4] This research was sponsored by the Division of Materials Sciences and Engineering, BES, DOE (RKV, SVK). Research was conducted at the Center for Nanophase Materials Sciences, which also provided support (AB, SJ) and is a DOE Office of Science User Facility.Google Scholar
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