Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-23T10:32:03.088Z Has data issue: false hasContentIssue false
  • English
  • Français

Automatic Hologram Acquisition of Pt Catalyst Nanoparticles on TiO2 Using Particle Detection with Image Processing and AI Classification

Published online by Cambridge University Press:  30 July 2021

Fumiaki Ichihashi ,
Akira Koyama ,
Tetsuya Akashi ,
Shoko Miyauchi ,
Ken'ichi Morooka ,
Hajime Hojo ,
Hisahiro Einaga ,
Toshiaki Tanigaki ,
Hiroyuki Shinada  and
Yasukazu Murakami
Fumiaki Ichihashi
Affiliation:
Hitachi Ltd., Saitama, Japan
Akira Koyama
Affiliation:
Department of Applied Quantum Physics and Nuclear Engineering, Kyushu University, Fukuoka, Japan
Tetsuya Akashi
Affiliation:
Research & Development Group, Hitachi, Ltd., Hatoyama, Saitama, Japan
Shoko Miyauchi
Affiliation:
Graduate School of Information Science and Electrical Engineering, Kyushu University, Fukuoka, Japan
Ken'ichi Morooka
Affiliation:
Graduate School of Natural Science and Technology, Okayama University, Okayama, Japan
Hajime Hojo
Affiliation:
Department of Materials Science, Faculty of Engineering Sciences, Kyushu University, Fukuoka, Japan
Hisahiro Einaga
Affiliation:
Department of Materials Science, Faculty of Engineering Sciences, Kyushu University, Fukuoka, Japan
Toshiaki Tanigaki
Affiliation:
Research & Development Group, Hitachi, Ltd., Saitama, Japan
Hiroyuki Shinada
Affiliation:
Research & Development Group, Hitachi, Ltd., Hatoyama, Saitama, Japan
Yasukazu Murakami
Affiliation:
Department of Applied Quantum Physics and Nuclear Engineering, Kyushu University, Fukuoka, Japan

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Full System and Workflow Automation for Enabling Big Data and Machine Learning in Electron Microscopy
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 252 - 253
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Akashi, T. et al. Appl. Phys. Lett., 106 (2015) 074101.Google Scholar
We are very grateful to Y. Takahashi and A. Sugawara for their collaboration and useful discussions. This work was supported by JST CREST Grant Number JPMJCR 1664, Japan.Google Scholar