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Automated Crystallographic Identification of Atom Probe's Ion Desorption Map

Published online by Cambridge University Press:  04 August 2017

Yimeng Chen ,
Katherine P. Rice ,
Ty J. Prosa ,
David A. Reinhard ,
Brian P. Geiser ,
Matt M. Nowell  and
Stuart I. Wright
Yimeng Chen
Affiliation:
CAMECA Instruments, Inc., Madison, WI, USA
Katherine P. Rice
Affiliation:
CAMECA Instruments, Inc., Madison, WI, USA
Ty J. Prosa
Affiliation:
CAMECA Instruments, Inc., Madison, WI, USA
David A. Reinhard
Affiliation:
CAMECA Instruments, Inc., Madison, WI, USA
Brian P. Geiser
Affiliation:
CAMECA Instruments, Inc., Madison, WI, USA
Matt M. Nowell
Affiliation:
EDAX, Draper, UT, USA
Stuart I. Wright
Affiliation:
EDAX, Draper, UT, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 662 - 663
Copyright
© Microscopy Society of America 2017 

References

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[6] Geiser, B. P, et al, Microscopy and Microanalysis 13 2007). p. 437.Google Scholar