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Retrospective Non-Uniform Illumination Correction Techniques in Images of Tuberculosis

Published online by Cambridge University Press:  13 August 2014

Ebenezer Priya ,
Subramanian Srinivasan  and
Swaminathan Ramakrishnan
Ebenezer Priya*
Affiliation:
Department of Instrumentation Engineering, Madras Institute of Technology, Anna University, Chrompet, Chennai-600044, India
Subramanian Srinivasan
Affiliation:
Department of Instrumentation Engineering, Madras Institute of Technology, Anna University, Chrompet, Chennai-600044, India
Swaminathan Ramakrishnan
Affiliation:
Biomedical Engineering Division, Department of Applied Mechanics, Indian Institute of Technology Madras, Chennai-600036, India
*
*Corresponding author. [email protected]
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Abstract

Image pre-processing is highly significant in automated analysis of microscopy images. In this work, non-uniform illumination correction has been attempted using the surface fitting method (SFM), multiple regression method (MRM), and bidirectional empirical mode decomposition (BEMD) in digital microscopy images of tuberculosis (TB). The sputum smear positive and negative images recorded under a standard image acquisition protocol were subjected to illumination correction techniques and evaluated by error and statistical measures. Results show that SFM performs more efficiently than MRM or BEMD. The SFM produced sharp images of TB bacilli with better contrast. To further validate the results, multifractal analysis was performed that showed distinct variation before and after implementation of illumination correction by SFM. Results demonstrate that after illumination correction, there is a 26% increase in the number of bacilli, which aids in classification of the TB images into positive and negative, as TB positivity depends on the count of bacilli.

Keywords

tuberculosissputum smear imagesnon-uniform illuminationpolynomial fitmultiple regressionbidirectional empirical mode decompositionmultifractal analysis
Type
Biological Applications
Information
Microscopy and Microanalysis , Volume 20 , Issue 5 , October 2014 , pp. 1382 - 1391
Copyright
© Microscopy Society of America 2014 

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