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Quantitative Low Loss and Ultra Low Loss Spectroscopy in the STEM

Published online by Cambridge University Press:  02 July 2020

A. Howie
Affiliation:
Cavendish Laboratory, University of Cambridge, Madingley Road, Cambridge, CB3 OHE, UK
F.J. Garcia de Abajo
Affiliation:
Centro Mixto CSIC-UPV/EHU, San Sebastian, Spain
N. Yamamoto
Affiliation:
Department of Physics, Tokyo Institute of Technology, Meguro-ku, Tokyo, 152-8551, Japan
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Abstract

Many of the topics in valence spectroscopy originally pioneered with TEM equipment have now been taken over by STEM. Notable exceptions are the studies by J. Silcox and his colleagues of plasmon dispersion and of the guided modes in thin slabs where retardation and other relativistic effects arise. The growing use of STEM valence EELS on increasingly complex nanostructures and the development of dielectric excitation theory for quantitative interpretation of the results were recently reviewed. The spatial resolution approaches the atomic scale, exceeding by orders of magnitude the capability of near field spectroscopy. By using the cathodoluminescence (CDL) signal, optical precision in STEM energy loss measurement can also be achieved, particularly in the difficult region below 5 eV or even 1 eV. High spatial resolution can be preserved provided that an intermediate stage of carrier diffusion is not involved in the radiative decay of excitations.

Figure 1 shows STEM CDL images of an Ag particle obtained from the dipole l=1 and quadrupole l=2 surface plasmon excitations

Type
Quantitative STEM: Imaging and EELS Analysis Honoring the Contributions of John Silcox (Organized by P. Batson, C. Chen and D. Muller)
Copyright
Copyright © Microscopy Society of America 2001

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References

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