In the last two decades, microscopy, in particular transmission electron microscopy, has moved from the research environment into industry. As such, the user requirements of the microscopes have changed. Previously, users required the highest performance in all aspects of microscopy e.g. imaging, analytical capabilities, with little regard to other factors. Today, additional requirements are being placed on areas such as ease of use, reliability, high throughput, expanded sample requirements, and networking capabilities. However, the “high performance” aspects of the instrumentation are still a high priority to the end user. These user requirements cause microscope manufacturers a dilemma in many instances. It is not always possible to provide the “new” requirements while still maintaining the high performance of the instruments, at a “reasonable” cost. An example is the large sample requirements in scanning electron microscopes. Large stages are inherently more prone to vibration than smaller stages, and therefore adversely affect resolution.