Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-29T17:48:08.291Z Has data issue: false hasContentIssue false
  • English
  • Français

The intensity changes of ultra-soft X-ray spectra of several light element oxides

Published online by Cambridge University Press:  03 August 2008

S Fukushima ,
T Ogiwara ,
T Kimura ,
K Tsukamoto ,
T Tazawa  and
S Tanuma
S Fukushima
Affiliation:
National Institute for Materials Science, Japan
T Ogiwara
Affiliation:
National Institute for Materials Science, Japan
T Kimura
Affiliation:
National Institute for Materials Science, Japan
K Tsukamoto
Affiliation:
JEOL Ltd Japan
T Tazawa
Affiliation:
JEOL Ltd Japan
S Tanuma
Affiliation:
National Institute for Materials Science, Japan
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1286 - 1287
Copyright
© 2008 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)