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Image Contrast in High Resolution Aberration Corrected Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  05 August 2007

M Oxley ,
K van Benthem ,
Y Peng  and
S Pennycook
M Oxley
Affiliation:
Oak Ridge National Laboratory
K van Benthem
Affiliation:
Oak Ridge National Laboratory
Y Peng
Affiliation:
Oak Ridge National Laboratory
S Pennycook
Affiliation:
Oak Ridge National Laboratory
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 906 - 907
Copyright
© 2007 Microscopy Society of America

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