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FIB Specimen Preparation for STEM and EFTEM Tomography

Published online by Cambridge University Press:  01 August 2004

Stephen M Schwarz  and
Lucille A Giannuzzi
Stephen M Schwarz
Affiliation:
University of Central Florida, Orlando, Florida NanoSpective, Inc., Orlando, Florida
Lucille A Giannuzzi
Affiliation:
NanoSpective, Inc., Orlando, Florida FEI Company, Hilsboro, Oregon
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 142 - 143
Copyright
© 2004 Microscopy Society of America

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