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EBIC Targeting for Dual Beam FIB Based TEM Sample Preparation

Published online by Cambridge University Press:  03 August 2008

N Presser ,
B Foran ,
Y Sin ,
M Mason  and
SC Moss
N Presser
Affiliation:
The Aerospace Corporation
B Foran
Affiliation:
The Aerospace Corporation
Y Sin
Affiliation:
The Aerospace Corporation
M Mason
Affiliation:
The Aerospace Corporation
SC Moss
Affiliation:
The Aerospace Corporation
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 392 - 393
Copyright
© 2008 Microscopy Society of America

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