Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Tsakalakos, Loucas
2010.
Nanotechnology for Photovoltaics.
p.
211.
PROSA, T. J.
ALVIS, R.
TSAKALAKOS, L.
and
SMENTKOWSKI, V. S.
2010.
Characterization of dilute species within CVD‐grown silicon nanowires doped using trimethylboron: protected lift‐out specimen preparation for atom probe tomography.
Journal of Microscopy,
Vol. 239,
Issue. 2,
p.
92.
Blumtritt, H
Isheim, D
Senz, S
Seidman, D N
and
Moutanabbir, O
2014.
Preparation of nanowire specimens for laser-assisted atom probe tomography.
Nanotechnology,
Vol. 25,
Issue. 43,
p.
435704.
Qu, Jiangtao
Ringer, Simon
and
Zheng, Rongkun
2015.
Atomic-scale tomography of semiconductor nanowires.
Materials Science in Semiconductor Processing,
Vol. 40,
Issue. ,
p.
896.
Qu, Jiangtao
Wong, Derek
Du, Sichao
Yang, Limei
Ringer, Simon
and
Zheng, Rongkun
2015.
Methodology exploration of specimen preparation for atom probe tomography from nanowires.
Ultramicroscopy,
Vol. 159,
Issue. ,
p.
427.
Kwak, C.-M.
Seol, J.-B.
Kim, Y.-T.
and
Park, C.-G.
2017.
Laser-assisted atom probe tomography of four paired poly-Si/SiO2 multiple-stacks with each thickness of 10 nm.
Applied Surface Science,
Vol. 396,
Issue. ,
p.
497.
Schwarz, Tim M
Woods, Eric
Singh, Mahander P
Chen, Xinren
Jung, Chanwon
Aota, Leonardo S
Jang, Kyuseon
Krämer, Mathias
Kim, Se-Ho
McCarroll, Ingrid
and
Gault, Baptiste
2024.
In Situ Metallic Coating of Atom Probe Specimen for Enhanced Yield, Performance, and Increased Field-of-View.
Microscopy and Microanalysis,