Hostname: page-component-586b7cd67f-vdxz6 Total loading time: 0 Render date: 2024-11-29T21:57:26.906Z Has data issue: false hasContentIssue false
  • English
  • Français

Aberration corrected STEM-EELS study of the hole distribution in cuprate superconductors

Published online by Cambridge University Press:  23 September 2015

M. Bugnet ,
G. Radtke ,
S. Loffler ,
P. Schattschneider ,
D. Hawthorn ,
G. A. Sawatzky  and
G. A. Botton
M. Bugnet
Affiliation:
Department of Materials Science and Engineering & CCEM, McMaster University, Hamilton, Canada.
G. Radtke
Affiliation:
UPMC - Paris 6, IMPMC-CNRS UMR 7590 Campus Jussieu, Paris, France.
S. Loffler
Affiliation:
Department of Materials Science and Engineering & CCEM, McMaster University, Hamilton, Canada. Institute of Solid State Physics and USCTEM, Vienna University of Technology, Vienna, Austria.
P. Schattschneider
Affiliation:
Institute of Solid State Physics and USCTEM, Vienna University of Technology, Vienna, Austria.
D. Hawthorn
Affiliation:
Department of Physics and Astronomy, University of Waterloo, Waterloo, ON, Canada.
G. A. Sawatzky
Affiliation:
Department of Physics and Astronomy, University of British Columbia, Vancouver, BC, Canada.
G. A. Botton
Affiliation:
Department of Materials Science and Engineering & CCEM, McMaster University, Hamilton, Canada.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 665 - 666
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Pennycook, SJ & Colliex, C, MRS Bulletin 37 (2012). p. 13.Google Scholar
[2] Loffler, S, et al, submitted..Google Scholar
[3] Gauquelin, N, et al, Nature. Communications 4 (2014). p. 1.Google Scholar
[4] Fink, J, et al, Physical Review B 42 (1990). p. 4823.CrossRefGoogle Scholar
[5] Rusydi, A, et al, Physical Review B 75 (2007). p. 104510.Google Scholar
[6] Bugnet, M, et al, in preparation..Google Scholar
[7] The experimental work has been performed at the Canadian Center for Electron Microscopy, a national facility supported by NSERC, the Canada Foundation for Innovation and McMaster University..Google Scholar