Advances in X-ray Analysis, Twenty-Second Annual Conference on Applications of X-ray Analysis, August 22-24, 1973
- This volume was published under a former title. See this journal's title history.
Research Article
X-Ray Cross-Sections in Design and Analysis of Non-Dispersive Systems
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- 06 March 2019, pp. 258-268
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Use of Multiple Standards for Absorption Correction and Quantitation with Frieda
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- 06 March 2019, pp. 269-278
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Resin-Loaded Papers - A Versatile Medium for Sampling and Standardization
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- 06 March 2019, pp. 279-292
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Chelating Ion Exchange Resins and X-Ray Fluorescence
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- 06 March 2019, pp. 293-301
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Can Regression Equations be Optimized By Finagling X-Ray Intensities?
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- 06 March 2019, pp. 302-308
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X-Ray Fluorescence Analysis of High-Temperature Super Alloys — Calibration and Standards
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- 06 March 2019, pp. 309-317
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Quantification of Sub-Microgram Elemental Concentrations Using Micro-Dot Samples
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- 06 March 2019, pp. 318-324
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A Rapid Direct X-Ray Fluorescence Method for Simultaneously Determining Brass Composition and Plating Weight for Brass-Plated-Steel Tire Cord Wires
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- 06 March 2019, pp. 325-336
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Quantitative Nondispersive X-Ray Fluorescence Analysis of Highly Radioactive Samples for Uranium and Plutonium Concentration *
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- 06 March 2019, pp. 337-347
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The Effects of Self-Irradiation on the Lattice of 238 (80%)PuO2.III*
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- 06 March 2019, pp. 348-353
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The Effects of X-Ray Optics on Residual Stress Measurements in Steel
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- 06 March 2019, pp. 354-370
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X-Ray Diffraction Residual Stress Analysis Using High Precision Centroid Shift Measurement Techniques - Application to Uranium-0.75 Weight Percent Titanium Alloy
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- 06 March 2019, pp. 371-383
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An X-Ray Amorphous Scattering Investigation of the Corrosion of a Potassium Silicate Glass K2O-3Si02
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- 06 March 2019, pp. 384-394
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A Review of X-Ray Diffraction Methods for Diffusion Studies
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- 06 March 2019, pp. 395-415
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Pole Figure Random Intensity Calculation Using Powder Integrated Ratios
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- 06 March 2019, pp. 416-422
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X-Ray Emission from Laser-Produced Plasmas
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- 06 March 2019, pp. 423-435
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Calculation and Measurement of Integral Reflection Coefficient Versus Wavelength of “Real” Crystals on an Absolute Basis
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- 06 March 2019, pp. 436-444
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X-Ray Production Cross Sections for Ti, Co, Ge, Rb and Sn by 16 - 44 Mev Oxygen Ion Bombardment*†
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- 06 March 2019, pp. 445-456
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Some Biomedical Applications of Charged-Particle-Induced X-Ray Fluorescence Analysis
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- 06 March 2019, pp. 457-466
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Qualitative Analysis of the Kossel Back Reflection Pattern from Selected Semiconductors
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- 06 March 2019, pp. 467-478
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