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A Secondary-Source, Energy-Dispersive X-Ray Spectrometer and its Application to Quantitative Analytical Chemistry

Published online by Cambridge University Press:  06 March 2019

R. P. Larsen
Affiliation:
Argonne National Laboratory, Argonne, Illinois 60439
J. O. Karttunen
Affiliation:
Argonne National Laboratory, Argonne, Illinois 60439
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Abstract

An energy-dispersive X-ray spectrometer that (1) uses as the primary excitation source the power supply and tungsten X-ray tube from a conventional crystal spectrometer (General Electric XRD-6) and (2) uses as the secondary excitation source elemental metal foils that are readily interchangeable has been built and operated. The use of an X-ray tube with a high-voltage capability, 75 kilovolts max, enables the determination of elements with atomic numbers as high as 66 (terbium) to be based on the K series of X-rays; the highpower capability, 3.7 kilowatts max, enables a particularly intense beam of X-rays to be generated by the secondary source and hence, provides a particularly high detection capability for trace elements in a sample. An instrument that uses interchangeable secondary sources to irradiate the samples has several advantages over those instruments in which excitation is accomplished by direct irradiation with an X-ray tube: (1) the background radiation in the energy range where the X-rays of interest are measured is several orders of magnitude lower and is very uniform and (2) the energy of the excitation radiation can be closely matched to the absorption edges of the elements of interest in the sample.

In the application of the instrument, particular emphasis has been placed on the development of tectmiques that will enable an energy-dispersive X-ray spectrometer to be used as the detection instrument for quantitative elemental analysis. Methods for the determination of the individual rare earths, plutonium and uranium at the microgram level with an accuracy of ± 1% are outlined and for the determination of plutonium and uranium at the milligram level with an accuracy of ± 0.1% are proposed.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1973

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References

1. Jaklevic, J. M., Giauque, R. D., Malone, D. F. and Searles, W. L., “Small X-Ray Tubes for Energy Dispersive Analysis Using Semi-Conductor Spectrometers,” Heinrich, K. F. J., Barrett, C. S., Mewkirk, J. B., and Ruud, Clayton O., Editors, Advances in X-Ray Analysis, Vol. 15, p. 266275, Plenum Press (1972).Google Scholar
2. Cooper, J. A., “Comparison of Particle and Photon Excited X-Ray Fluorescence Applied to Trace Element Measurements of Environmental Samples,Nucl. Inst. and Method 106, 525538 (1973).Google Scholar
3. Porter, D. E. and Waldseth, R., “X-Ray Energy Spectrometry,” Anal. Chem. 45, 604A-614A (1973).Google Scholar
4. Luke, C. L., “Determination of Trace Elements in Inorganic and Organic Materials by X-Ray Fluorescence Spectroscopy,Anal. Chim. Acta 41, 237250 (1968).Google Scholar
5. Rein, J. E., Zeigler, R. K. and Metz, C. F., “LMFBR/FFTF Fuel Development Analytical Program-Phase II,” Los Alamos Scientific Laboratory Report, LA-4407 (1970).Google Scholar