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Lama III - A Computer Program for Quantitative XRFA of Bulk Specimens and Thin Film Layers
Published online by Cambridge University Press: 06 March 2019
Abstract
The previous LAMA I and II programs have been completely rewritten in this new version. Better precision and an order of magnitude increase in speed were achieved with a different numerical method and more efficient code. Fundamental parameters and/or empirical parameter calculations can be used. New routines for the analysis of oxides and other compounds of light elements, and multiple thin film layers with secondary enhancement factors are included.
- Type
- VII. Mathematical Models and Computer Applications in XRF
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- Copyright
- Copyright © International Centre for Diffraction Data 1983
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