Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-23T15:30:38.029Z Has data issue: false hasContentIssue false
  • English
  • Français

FPT: An Integrated Fundamental Parameters Program for Broadband EDXRF Analysis without a Set of Similar Standards

Published online by Cambridge University Press:  06 March 2019

D. A. Gedcke ,
L. G. Byars  and
N. C. Jacobus
D. A. Gedcke
Affiliation:
EG & G ORTEC, Oak Ridge, Tennessee 37830 U.S.A.
L. G. Byars
Affiliation:
EG & G ORTEC, Oak Ridge, Tennessee 37830 U.S.A.
N. C. Jacobus
Affiliation:
EG & G ORTEC, Oak Ridge, Tennessee 37830 U.S.A.
Get access

Extract

The x-ray fluorescence (XRF) method is well known for its capability to perform fast and accurate quantitative analysis for all elements with atomic numbers greater than ten. Energy dispersive x-ray fluorescence (EDXRF) adds to this capability the benefit of quick qualitative analysis, due to its simultaneous sensitivity to all the elements. The method has the potential for rapid and complete chemical analysis of any sample which arrives on the analytical chemist's doorstep. Although the method has been a productive tool for fast and accurate repetitive analysis of similar samples, its applicability to unique unknowns has been rather limited. The limitation arises from the usual need to calibrate the instrument's response with a set of 6 to 12 standards, whose compositions must be similar to the unknown sample. Anyone who has struggled to develop and maintain such a suite of accurately certified standards knows that a great deal of effort and expense is involved. This effort is well justified when the analyst expects to analyze the same type of material frequently over an extended tine period. However, for a unique sample analysis, the task of developing a suite of similar standards simply makes the analysis impractical. What is needed is a method that requires minimal standards, or uses no standards at all.

Type
VII. XRF Computer Systems and Mathematical Corrections
Information
Advances in X-Ray Analysis , Volume 26: Thirty-First Annual Conference on Applications of X-ray Analysis, August 1-6, 1982 , 1982 , pp. 355 - 368
Copyright
Copyright © International Centre for Diffraction Data 1982

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Gillam, E. and Heal, H. T., Brit. J. Appl. Phys. 37:353 (1952).Google Scholar
2. Sherman, J., Spectrochlm. Acta 7:283 (1955).Google Scholar
3. Shiraiwa, T. and Fujino, N., Japan J. Appl. Phys. 5:886 (1966).Google Scholar
4. Sparks, C. J., Jr., Adv. X-ray Anal. 19:19 (1976).Google Scholar
5. Criss, J. W., Adv. X-ray Anal. 23:93 (1980).Google Scholar
6. Criss, J. W., Birks, L. S., and Gilfrich, J. V., Anal. Chem. 50:33 (1973).Google Scholar
7. Gould, R. W. and Bates, S. R., X-ray Spectrom 1:29 (1972)Google Scholar
8. Criss, J. W. and Birks, L. S., Anal. Chem. 40:1080 (1968).Google Scholar
9. Stephenson, Donald A., Anal. Chem. 43:1761 (1971).Google Scholar
10. Ciccarelli, Michael F., Anal. Chem. 49:345 (1977).Google Scholar
11. Otvos, J. W., Wyld, G. E. A., and Yao, T. C., Adv. X-ray Anal. 20:217 (1977).Google Scholar
12. Shen, R. B. and Russ, J. C., X-ray Spectrom 6:56 (1977).Google Scholar
13. Jenkins, Ron, Gould, R. W., Gedcke, Dale, “Quantitative X-ray Spectrometry”, Marcel Dekker, Inc., New York (1981), sections 2.9 and 10.7.Google Scholar
14. Gedcke, D. A., Byars, L. G., and Hardy, W. H., SEM/1982, Ed. pressGoogle Scholar
15. McMaster, W. H., Kerr Del Grande, N., Mallett, J. H., and Hubbell, J. H., “Compilation of X-ray Cross Sections”, UCRL-50174, National Technical Information Service, Springfield, VA (1969)Google Scholar
16. Bambynek, Walter, Craseroann, Bernd, Fink, R. W., Freund, H. U., Mark, Hans, Swift, C. D., Price, R. E., Venugopala Rao, P., Rev. Mod. Bhys. 44:716 (1972).Google Scholar
17. Krause, M. O'., Nester, C. W., Jr., Sparks, C. J., Jr., and Ricci, E., “X-ray Fluorescence Cross Sections for K and L X-rays of the Elements, ORNL-5399”, Oak Ridge National Laboratory, Oak Ridge, TN (1978).Google Scholar
18. Bearden, J. A., Rev. Mod. Phys. 39:78 (1967).Google Scholar
19. Shen, R. B., Criss, J., Russ, J. C., Sandborg, A. O., Adv. X-ray Anal. 23:99 (1980).Google Scholar
20. Wheeler, Bradner D. and Jacobus, Nancy, Adv. X-ray Anal. 22:395 (1979). See also the preprint published by EG&G ORIEC for additional details.Google Scholar